Poult. Sci. -- Index by Author (Mar 2008; Volume 87, Number 3)

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Index by Author: Mar 2008; 87 (3) [Table of Contents]

A | B | C | D | E | F | G | H | I | J | K | L | M | N | O | P | Q | R | S | T | U | V | W | X | Y | Z

A: Ahmed, S. [Abstract] [Full Text] [PDF]; Angel, R. [Abstract] [Full Text] [PDF]; Applegate, T. [Abstract] [Full Text] [PDF]; Arckens, L. [Abstract] [Full Text] [PDF]
B: Babar, M. E. [Abstract] [Full Text] [PDF]; Bailey, C. A. [Abstract] [Full Text] [PDF]; Barroeta, A. C. [Abstract] [Full Text] [PDF]; Barroeta, A. C. [Abstract] [Full Text] [PDF]; Baucells, M. D. [Abstract] [Full Text] [PDF]; Baucells, M. D. [Abstract] [Full Text] [PDF]; Berri, C. [Abstract] [Full Text] [PDF]; Besnard, J. [Abstract] [Full Text] [PDF]; Beynen, A. C. [Abstract] [Full Text] [PDF]; Boermans, H. J. [Abstract] [Full Text] [PDF]; Brake, J. [Abstract] [Full Text] [PDF]; Brake, J. [Abstract] [Full Text] [PDF]; Branton, S. L. [Abstract] [Full Text] [PDF]; Branton, S. L. [Abstract] [Full Text] [PDF]; Bruggeman, V. [Abstract] [Full Text] [PDF]; Buchwalder, T. [Abstract] [Full Text] [PDF]; Buhr, R. J. [Abstract] [Full Text] [PDF]; Burnham, M. R. [Abstract] [Full Text] [PDF]; Burton, J. W. [Abstract] [Full Text] [PDF]
C: Caldwell, D. J. [Abstract] [Full Text] [PDF]; Carey, J. B. [Abstract] [Full Text] [PDF]; Cartwright, A. L. [Abstract] [Full Text] [PDF]; Cason, J. A. [Abstract] [Full Text] [PDF]; Chan, J. P. [Abstract] [Full Text] [PDF]; Chou, C.-C. [Abstract] [Full Text] [PDF]
D: Davis, A. J. [Abstract] [Full Text] [PDF]; De Baerdemaeker, J. [Abstract] [Full Text] [PDF]; De Smit, L. [Abstract] [Full Text] [PDF]; Debonne, M. [Abstract] [Full Text] [PDF]; Decuypere, E. [Abstract] [Full Text] [PDF]; den Hartog, L. A. [Abstract] [Full Text] [PDF]; Denti, R. [Abstract] [Full Text] [PDF]
E: Esteve-García, E. [Abstract] [Full Text] [PDF]; Everaert, N. [Abstract] [Full Text] [PDF]
F: Fasenko, G. M. [Abstract] [Full Text] [PDF]; Ferket, P. R. [Abstract] [Full Text] [PDF]; Ferrini, G. [Abstract] [Full Text] [PDF]; Fletcher, D. L. [Abstract] [Full Text] [PDF]; Freeman, M. E. [Abstract] [Full Text] [PDF]
G: Gasco, L. [Abstract] [Full Text] [PDF]; Geelen, M. J. H. [Abstract] [Full Text] [PDF]; Gerard, P. D. [Abstract] [Full Text] [PDF]; Gerard, P. D. [Abstract] [Full Text] [PDF]; Gerrits, W. J. J. [Abstract] [Full Text] [PDF]; Girish, C. K. [Abstract] [Full Text] [PDF]; Guo, K. [Abstract] [Full Text] [PDF]; Gutierrez, O. [Abstract] [Full Text] [PDF]
H: Haddad, R. [Abstract] [Full Text] [PDF]; Han, J. Y. [Abstract] [Full Text] [PDF]; Hernandez, E. [Abstract] [Full Text] [PDF]; Hester, P. Y. [Abstract] [Full Text] [PDF]; Hinds, M. [Abstract] [Full Text] [PDF]; Hoehler, D. [Abstract] [Full Text] [PDF]; Hong, Y. H. [Abstract] [Full Text] [PDF]; Hovenier, R. [Abstract] [Full Text] [PDF]; Huber-Eicher, B. [Abstract] [Full Text] [PDF]
I: Ingram, K. D. [Abstract] [Full Text] [PDF]
J: Jacobs, C. M. [Abstract] [Full Text] [PDF]
K: Kamers, B. [Abstract] [Full Text] [PDF]; Kamran, Z. [Abstract] [Full Text] [PDF]; Kao, J.-P. [Abstract] [Full Text] [PDF]; Karrow, N. A. [Abstract] [Full Text] [PDF]; Kawashima, M. [Abstract] [Full Text] [PDF]; Khawaldeh, G. [Abstract] [Full Text] [PDF]; Kim, D. K. [Abstract] [Full Text] [PDF]; Koh, B.-W. [Abstract] [Full Text] [PDF]; Kruschwitz, A. [Abstract] [Full Text] [PDF]; Kwakkel, R. P. [Abstract] [Full Text] [PDF]; Kwanyuen, P. [Abstract] [Full Text] [PDF]; Kwanyuen, P. [Abstract] [Full Text] [PDF]
L: Lamont, S. J. [Abstract] [Full Text] [PDF]; Latour, M. A. [Abstract] [Full Text] [PDF]; Lee, W.-M. [Abstract] [Full Text] [PDF]; Leytem, A. B. [Abstract] [Full Text] [PDF]; Leytem, A. B. [Abstract] [Full Text] [PDF]; Liebergesell, M. [Abstract] [Full Text] [PDF]; Lillehoj, E. P. [Abstract] [Full Text] [PDF]; Lillehoj, H. S. [Abstract] [Full Text] [PDF]; Liu, C.-H. [Abstract] [Full Text] [PDF]; Liu, H. Y. [Abstract] [Full Text] [PDF]; Lobee, H. W. J. [Abstract] [Full Text] [PDF]
M: Maguire, R. O. [Abstract] [Full Text] [PDF]; Maguire, R. O. [Abstract] [Full Text] [PDF]; Mahmood, S. [Abstract] [Full Text] [PDF]; Manzanilla, E. G. [Abstract] [Full Text] [PDF]
N: Nadeem, M. A. [Abstract] [Full Text] [PDF]; Neuman, S. [Abstract] [Full Text] [PDF]; Nisa, M. [Abstract] [Full Text] [PDF]; Northcutt, J. K. [Abstract] [Full Text] [PDF]
O: O’Dea, E. E. [Abstract] [Full Text] [PDF]; Onagbesan, O. [Abstract] [Full Text] [PDF]
P: Park, D. W. [Abstract] [Full Text] [PDF]; Parsons, C. M. [Abstract] [Full Text] [PDF]; Peebles, E. D. [Abstract] [Full Text] [PDF]; Peebles, E. D. [Abstract] [Full Text] [PDF]; Plumstead, P. W. [Abstract] [Full Text] [PDF]; Plumstead, P. W. [Abstract] [Full Text] [PDF]; Powers, W. [Abstract] [Full Text] [PDF]
R: Relandeau, C. [Abstract] [Full Text] [PDF]; Rice, D. [Abstract] [Full Text] [PDF]; Roussan, D. A. [Abstract] [Full Text] [PDF]
S: Santos, A. A., Jr. [Abstract] [Full Text] [PDF]; Santos, F. B. O. [Abstract] [Full Text] [PDF]; Sarwar, M. [Abstract] [Full Text] [PDF]; Sauber, T. [Abstract] [Full Text] [PDF]; Scanes, C. G. [Full Text] [PDF]; Schiavone, A. [Abstract] [Full Text] [PDF]; Sheldon, B. W. [Abstract] [Full Text] [PDF]; Smink, W. [Abstract] [Full Text] [PDF]; Smith, B. [Abstract] [Full Text] [PDF]; Smith, D. P. [Abstract] [Full Text] [PDF]; Smith, T. K. [Abstract] [Full Text] [PDF]; Spears, J. W. [Abstract] [Full Text] [PDF]; Spradley, J. M. [Abstract] [Full Text] [PDF]; Stuhec, I. [Abstract] [Full Text] [PDF]
T: Takahashi, T. [Abstract] [Full Text] [PDF]; Tassone, S. [Abstract] [Full Text] [PDF]; Tona, J. K. [Abstract] [Full Text] [PDF]
U: Utterback, P. L. [Abstract] [Full Text] [PDF]
V: van der Peet-Schwering, C. M. C. [Abstract] [Full Text] [PDF]; van Krimpen, M. M. [Abstract] [Full Text] [PDF]; Vance, A. M. [Abstract] [Full Text] [PDF]; Verstegen, M. W. A. [Abstract] [Full Text] [PDF]; Verstegen, M. W. A. [Abstract] [Full Text] [PDF]; Villaverde, C. [Abstract] [Full Text] [PDF]; Viscione, K. A. [Abstract] [Full Text] [PDF]
W: Whitmarsh, S. K. [Abstract] [Full Text] [PDF]; Whitmarsh, S. K. [Abstract] [Full Text] [PDF]; Wilson, J. L. [Abstract] [Full Text] [PDF]; Witters, A. [Abstract] [Full Text] [PDF]
Y: Yeh, L.-C. [Abstract] [Full Text] [PDF]
Z: Zhai, W. [Abstract] [Full Text] [PDF]; Zhang, C. [Abstract] [Full Text] [PDF]; Zhang, C. Q. [Abstract] [Full Text] [PDF]; Zoccarato, I. [Abstract] [Full Text] [PDF]; Zupan, M. [Abstract] [Full Text] [PDF]